Turning proven technologies into the Next Big Thing...
into universal testers...
Oakland Instrument Corporation
7405 Bush Lake Road, Minneapolis, Minnesota 55439 USA
Tel & Fax: (952) 835-4935 Web: www.OaklandInstrument.com Email:
Test instruments for
Built Around You
The Model 16 LayerGauge (shown far left) also provides profiling capabilities by
hand-feeding the sample across the sensor area to pre-defined distances between sample
points. Or, the Model 16 provides quick spot checks of individual areas of concern.
Safe, and easy to use, the Model 16 is a cost-effective addition for your film manufacturing
The industry-leading M-Flex Software combined with the LayerGauge measurement console
provides a user-friendly environment to capture layer thickness information with
unparalleled resolution and accuracy.
Model LG-9152 Layer Analysis Microscope with Video Microscope Camera or with Digital
Microscope Camera and analysis software. Packaged to include microscope, lighting
system, magnification components, cameras, and analysis software or video systems
for a complete solution to your film layer analysis needs.
Designed for precise measurement of individual layer thickness in coextruded films
and coated materials with unsurpassed accuracy and resolution. Oakland also offers
a complete line of accessories for your LayerGaugeTM, including microscope systems,
layer measurement software, and sample preparation accessories to meet todays’ demanding
quality control requirements for barrier and complex film structures.
Available in two models, the Model 16 and the Model 32, each with a unique range
of automatic and manual features.
The Model 32 LayerGauge provides full automatic profiling capabilities, and includes
unwind & rewind rollers for convenient sample handling plus speed & tension adjustability
of the sample rollers to ensure optimum sample transport.
Oakland is pleased to introduce the LayerGaugeTM range of benchtop multi-layer film
thickness gauges and analysis software by Davinor.
Oakland Introduces Multilayer Thickness Measurement Systems and Microscopes for Coex