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MT Series Universal Testers >>

Layer thickness analysis >>

Electronic Dart Drop Testers >>

Coex film

layer analysis

has never

been easier...

Turning proven technologies into the Next Big Thing...

Putting the

Universal back

into universal testers...

Test instruments for

quality control,

Built Around You

OAKLAND

INSTRUMENT CORPORATION

The Model 16 LayerGauge (shown far left) also provides profiling capabilities by hand-feeding the sample across the sensor area to pre-defined distances between sample points. Or, the Model 16 provides quick spot checks of individual areas of concern. Safe, and easy to use, the Model 16 is a cost-effective addition for your film manufacturing process.

The industry-leading M-Flex Software combined with the LayerGauge measurement console provides a user-friendly environment to capture layer thickness information with unparalleled resolution and accuracy.

Model LG-9152 Layer Analysis Microscope with Video Microscope Camera or with Digital Microscope Camera and analysis software. Packaged to include microscope, lighting system, magnification components, cameras, and analysis software or video systems for a complete solution to your film layer analysis needs.

Designed for precise measurement of individual layer thickness in coextruded films and coated materials with unsurpassed accuracy and resolution. Oakland also offers a complete line of accessories for your LayerGaugeTM, including microscope systems, layer measurement software, and sample preparation accessories to meet todays’ demanding quality control requirements for barrier and complex film structures.

Available in two models, the Model 16 and the Model 32, each with a unique range of automatic and manual features.

The Model 32 LayerGauge provides full automatic profiling capabilities, and includes unwind & rewind rollers for convenient sample handling plus speed & tension adjustability of the sample rollers to ensure optimum sample transport.

Oakland is pleased to introduce the LayerGaugeTM range of benchtop multi-layer film thickness gauges and analysis software by Davinor.

Oakland Introduces Multilayer Thickness Measurement Systems and Microscopes for Coex Film Analysis