Our CX-1025, the correct choice for high resolution film thickness profiling, with
AutoCalTM for self-calibration, and parallelism-adjustable anvils for high-accuracy
point-to-point contact profiling.
Software-driven thickness profiling couldn’t be simpler. The Model CX-1025.
Oakland pioneered all of the advances in benchtop film thickness gauging introduced
since 1986, including Microsoft Windows TM operating system software operation, Polar
Plots for the blown film industry, our patented AutoCalTM self-calibration technique
for capacitance gauges, advanced statistical data computation and reporting, and
data export capability to ExcelTM, AccessTM, Hertzler Systems, and other popular
third-party software packages.
Designed for rugged dependability and ease-of-use,
the CX-1025 can help solve the toughest thickness deviation problems. Our AutoCalTM
Feature allows automatic self-calibration of the capacitance non-contact sensor;
plus, the AutoCalTM Contact Probe with parallelism-adjustable anvil sections can
be used, independently, for high-accuracy point-to-point (discrete) contact thickness
profiling of your thin films or laminate materials (< 1 mil).
Available in two versions: the CX-1025a with a Manual Parallelism-Adjustable Anvil
(inset photo upper left; and the CX-1025b with Floating Anvil Automatic Parallelism-Adjustment
capability (inset photo upper right).
